Today we are machining some metal inside the scanning electron microscope! By creating a custom fixture, we can manually ...

Researchers from the National Institute of Standards and Technology (NIST) and KLA Corporation, a provider of inspection and measurement systems for the semiconductor and related industries, have ...

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

Since the first transmission electron microscope was sold in 1935, microscopes that use electrons--rather than light waves--to image objects have brought into focus levels of detail that were ...

-Further evolution makes it possible to leave observation and analysis to the instrument, improving efficiency- TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces the ...

Electron microscopy (EM) has become an indispensable tool for investigating the nanoscale structure of a large range of materials, across physical and life sciences. It is vital for characterisation ...

With a so-called cryo plasma-FIB (Plasma Focused Ion Beam) scanning electron microscope with nanomanipulator, Goethe University in Frankfurt (Germany) is expanding its research infrastructure with a ...

The Intel i486 might be over 30 years old, but it's still an incredible piece of technology. Especially when viewed up close ...

Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

It’s a problem that few of us will ever face, but if you ever have to calibrate your scanning electron microscope, you’ll need a resolution target with a high contrast under an electron beam. This ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...